Optoelectronic Transceiver Test

X-BERT is a low-cost, modular Bit Error Rate Test Platform used for verification and test of 10Gb/s and above optical and electrical chip, sub assembly and system designs. ParalleX™ allows users to perform several BER tests at once using a single clock source. The system is ideal for developers desiring to run simultaneous BER tests on parallel interfaces or multiple independent interfaces. XBERT and ParalleX™ are scalable so users can start off with a single channel and add modules to grow the system.

Transmitter Eye Testing (TOSA Test)

Using an optical storage oscilloscope such as the EXFO PSO-100, the transceiver under test is stimulated with a steady pattern from the BERT. A full rate clock trigger is provided to the optical oscilloscope. The eye diagram on the oscilloscope provides an intuitive display of parametric performance of the transmitter and aids in locating the cause of BER degradation. In addition, compliance to a particular optical mask can be tested. 

Receiver Sensitivity Testing (ROSA Test)

Bit patterns from the pattern generator are provided to a reference transmitter which stimulates the receiver under test.

To test receiver sensitivity, an optical attenuator is inserted before the receiver under test.  The addition of an optical splitter permits measurement of optical power incident on the receive channel as the attenuation is varied.  As attenuation is increased, bit error rate is measured and plotted versus receive channel power.

The Luceo X-BERT is well adapted to performing sensitivity measurements.   The reference transmitter can be part of a transceiver housed in and powered from an internal transceiver adapter module. An optical attenuator and power meter are also available as modules in the same test system.  The test components for both electrical and optical characterization are controlled through a unified graphical interface to provide at-a-glance measurement results.